2013 IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium to be held in NYC October 2-4, 2013. Topics include:
- Yield Analysis and Modeling
- Testing Techniques
- Error Detection, Correction, and Recovery
- Design For Testability in IC Design
- Dependability Analysis and Validation
- Defect and Fault Tolerance
- Repair, Restructuring and Reconfiguration
- Totally Fail-Safe Design for Critical Applications
- Emerging Technologies
- Hardware security