Measuring IV characteristics of FETs, and nanodevices can be challenging. A number of useful reference on IV measurements and related information can be found at the links below.
- The parametric Measurement Handbook - 3rd Edition (registration required to access)
- Agilent Impedance Measurement Handbook
- Keithley Measurement Handbooks (registration required)
- EE Time Fundamentals of IV Measurement (webinar registration required to see archive)
- ECE 656: Electronic Transport in Semiconductors (Fall 2011) By Mark Lundstrom see lectures 17 & 18